J. Wichelmann et al., "MAMBO-V: Dynamic Side-Channel Leakage Analysis on RISC-V"¹

RISC-V is an emerging technology, with applications ranging from embedded devices to high-performance servers. Therefore, more and more security-critical workloads will be conducted with code that is compiled for RISC-V. Well-known microarchitectural side-channel attacks against established platforms like x86 apply to RISC-V CPUs as well. As RISC-V does not mandate any hardware-based side-channel countermeasures, a piece of code compiled for a generic RISC-V CPU in a cloud server cannot make safe assumptions about the microarchitecture on which it is running. Existing tools for aiding software-level precautions by checking side-channel vulnerabilities on source code or x86 binaries are not compatible with RISC-V machine code.
In this work, we study the requirements and goals of architecture-specific leakage analysis for RISC-V and illustrate how to achieve these goals with the help of fast and precise dynamic binary analysis. We implement all necessary building blocks for finding side-channel leakages on RISC-V, while relying on existing mature solutions when possible. Our leakage analysis builds upon the modular side-channel analysis framework Microwalk, that examines execution traces for leakage through secret-dependent memory accesses or branches. To provide suitable traces, we port the ARM dynamic binary instrumentation tool MAMBO to RISC-V. Our port named MAMBO-V can instrument arbitrary binaries which use the 64-bit general purpose instruction set. We evaluate our toolchain on several cryptographic libraries with RISC-V support and identify multiple exploitable leakages.

#arXiv #ResearchPapers #RISCV #SideChannelAnalysis #SideChannelVulnerabilities
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¹ https://arxiv.org/abs/2305.00584

MAMBO-V: Dynamic Side-Channel Leakage Analysis on RISC-V

RISC-V is an emerging technology, with applications ranging from embedded devices to high-performance servers. Therefore, more and more security-critical workloads will be conducted with code that is compiled for RISC-V. Well-known microarchitectural side-channel attacks against established platforms like x86 apply to RISC-V CPUs as well. As RISC-V does not mandate any hardware-based side-channel countermeasures, a piece of code compiled for a generic RISC-V CPU in a cloud server cannot make safe assumptions about the microarchitecture on which it is running. Existing tools for aiding software-level precautions by checking side-channel vulnerabilities on source code or x86 binaries are not compatible with RISC-V machine code. In this work, we study the requirements and goals of architecture-specific leakage analysis for RISC-V and illustrate how to achieve these goals with the help of fast and precise dynamic binary analysis. We implement all necessary building blocks for finding side-channel leakages on RISC-V, while relying on existing mature solutions when possible. Our leakage analysis builds upon the modular side-channel analysis framework Microwalk, that examines execution traces for leakage through secret-dependent memory accesses or branches. To provide suitable traces, we port the ARM dynamic binary instrumentation tool MAMBO to RISC-V. Our port named MAMBO-V can instrument arbitrary binaries which use the 64-bit general purpose instruction set. We evaluate our toolchain on several cryptographic libraries with RISC-V support and identify multiple exploitable leakages.

arXiv.org

M. Avital and I. Levi, "SCMA: Plaintext Classification Assisted Side Channel Spectral Modulation Attacks. Towards Noise-insensitive SCA Attacks..."¹

Side-channel analysis (SCA) attacks manifest a significant challenge to the security of cryptographic devices. In turn, it is generally quite expensive to protect from SCAs (energy, area, performance etc.). In this work we exhibit a significant change in paradigm for SCA attacks: our proposed attack is quite different from conventional SCA attacks and is able to filter out physical measurement noise, algorithmic noise, as well as thwart various countermeasures, and extract information from the entire leakage waveform as a whole and not only points-of-interest. We demonstrate on measured devices break of masking schemes of orders 2 and 3, supported by a model and also shuffling and dual-rail based countermeasures model; all performed efficiently with the same methodology, and with orders of magnitude less measurements and smaller computation time; underpinning the importance of this form of attack.
In essence, in our attack we assume nothing different than a standard side-channel attack, i.e., a known plaintext scenario. However, we further group and classify leakages associated with specific subsets of plaintexts bits. The fact that we group specific (sub-)plaintexts associated leakages, and than in the next stage group or concatenate the associated leakages of these large groups in a predefined ordered sequence (modulation), enables far stronger attacks against SCA protected and unprotected designs. The evaluation-domain or the modulation-domain is the frequency domain in which per frequency it is possible to build a two feature constellation diagrams (amplitude and phase) and construct distinguishers over these diagrams.
On top of the methodological contribution of this new SCA, the main observation we push forward is that practically such an attack is devastating for many countermeasures we were used to consider as secure to some level, such as masking or shuffling with large permutation size[...]

#IACR #ResearchPapers #SideChannelAnalysis

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¹ https://eprint.iacr.org/2023/459

SCMA: Plaintext Classification Assisted Side Channel Spectral Modulation Attacks. Towards Noise-insensitive SCA Attacks...

This should be interesting... More sidechannel attack stuff:
https://www.youtube.com/watch?v=rf63D1fdOJM
From this paper:
Breaking a Fifth-Order Masked Implementation of CRYSTALS-Kyber by Copy-Paste
https://eprint.iacr.org/2022/1713.pdf
#sidechannelattacks #sidechannelanalysis #SecurityHacks
Session on PQC

YouTube

D. H. Mehta et al. "Bake It Till You Make It: Heat-induced Leakage from Masked Neural Networks"¹

Masking has become one of the most effective approaches for securing hardware designs against side-channel attacks. Irrespective of the effort put into correctly implementing masking schemes on a field programmable gate array (FPGA), leakage can be unexpectedly observed. This is due to the fact that the assumption underlying all masked designs, i.e., the leakages of different shares are independent of each other, may no longer hold in practice. In this regard, extreme temperatures have been shown to be an important factor in inducing leakage, even in correctly-masked designs. This has previously been verified using an external heat generator (i.e., a climate chamber). In this paper, we examine whether the leakage can be induced using the circuit components themselves. Specifically, we target masked neural networks (NNs) in FPGAs, with one of the main building blocks being block random access memory (BRAM) and flip-flops (FFs). In this respect, thanks to the inherent characteristics of NNs, our novel internal heat generators leverage solely the memories devoted to storing the user’s input, especially when frequently writing alternating patterns into BRAMs and FFs. The possibility of observing first-order leakage is evaluated by considering one of the most recent and successful first-order secure masked NNs, namely ModuloNET. ModuloNET is specifically designed for FPGAs, where BRAMs are used for storing the inputs and intermediate computations. Our experimental results demonstrate that undesirable first-order leakage can be observed by increasing the temperature when an alternating input is applied to the masked NN. To give a better understanding of the impact of extreme heat, we further perform a similar test on the design with FFs storing the input, where the same conclusion can be drawn.

#IACR #ResearchPapers #FPGA #NeuralNetworks #SideChannelAnalysis
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¹ https://eprint.iacr.org/2023/076

Bake It Till You Make It: Heat-induced Power Leakage from Masked Neural Networks

Masking has become one of the most effective approaches for securing hardware designs against side-channel attacks. Regardless of the effort put into correctly implementing masking schemes on a field-programmable gate array (FPGA), leakage can be unexpectedly observed. This is due to the fact that the assumption underlying all masked designs, i.e., the leakages of different shares are independent of each other, may no longer hold in practice. In this regard, extreme temperatures have been shown to be an important factor in inducing leakage, even in correctly masked designs. This has previously been verified using an external heat generator (i.e., a climate chamber). In this paper, we examine whether the leakage can be induced using the circuit components themselves without making any changes to the design. Specifically, we target masked neural networks (NNs) in FPGAs, one of the main building blocks of which is block random access memory (BRAM). In this respect, thanks to the inherent characteristics of NNs, our novel internal heat generators leverage solely the memories devoted to storing the user’s input, especially when frequently writing alternating patterns into BRAMs. The possibility of observing first-order leakage is evaluated by considering one of the most recent and successful first-order secure masked NNs, namely ModuloNET. ModuloNET is specifically designed for FPGAs, where BRAMs are used to store inputs and intermediate computations. Our experimental results demonstrate that undesirable first-order leakage can be observed and exploited by increasing the temperature when an alternating input is applied to the masked NN. To give a better understanding of the impact of extreme heat, we further perform a similar test on the design using an external heat generator, where a similar conclusion can be drawn.

IACR Cryptology ePrint Archive

D. Lammers et al., "Glitch-free is not Enough - Revisiting Glitch-Extended Probing Model"¹

Today, resistance to physical defaults is a necessary criterion for masking schemes. In this context, the focus has long been on designing masking schemes guaranteeing security in the presence of glitches. Sadly, immunity against glitches increases latency as registers must stop the glitch propagation. Previous works could reduce the latency by removing register stages but only by impractically increasing the circuit area. Nevertheless, some relatively new attempts avoid glitches by applying DRP logic styles. Promising works in this area include LMDPL, SESYM - both presented at CHES - and Self-Timed Masking - presented at CARDIS - enabling to mask arbitrary circuits with only one cycle latency. However, even if glitches no longer occur, there are other physical defaults that may violate the security of a masked circuit. Imbalanced delay of dual rails is a known problem for the security of DRP logic styles such as WDDL but not covered in formal security models.
In this work, we fill the gap by presenting the delay-extended probing security model, a generalization of the popular glitch-extended probing model, covering imbalanced delays. We emphasize the importance of such a model by a formal and practical security analysis of LMDPL, SESYM, and Self-Timed Masking. While we formally prove the delay-extended security of LMDPL and Self-Timed Masking, we show that SESYM fails to provide security under our defined security model what causes detectable leakage through experimental evaluations. Hence, as the message of this work, avoiding glitches in combination with d-probing security is not enough to guarantee physical security in practice.

#IACR #ResearchPapers #SideChannelAnalysis #Masking #Glitching
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¹ https://eprint.iacr.org/2023/035

A Deep Analysis of two Glitch-Free Hardware Masking Schemes SESYM and LMDPL