Materials scientists have developed a custom, Python-based software workflow to rapidly analyze high-resolution X-ray diffraction data, successfully measuring microscopic defects in diamond and other wide-bandgap semiconductors.
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https://www.sflorg.com/2026/06/ms06242601.html
Automated Semiconductor Defect Detection

Researchers built an automated X-ray diffraction workflow to rapidly measure microscopic defects in advanced wide-bandgap semiconductors.