Beilstein-InstitutJan 9, 2023

Nobuyuki Ishida, National Institute for Materials Science πŸ‡―πŸ‡΅, presents an alternative stable reference for #KelvinProbeForceMicroscopy (KPFM) measurements performed on #electrochemicaldevices without a reference #electrode. #electrochemistry ⚑

πŸ”— https://www.beilstein-journals.org/bjnano/articles/13/129

#DiamondOpenAccess πŸ’ŽπŸ”“ #BJNANO

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy

Beilstein Journal of Nanotechnology