edp sciences#Journals | #EPJ Applied Physics
"The reliability impact of N doping on the HfO2 charge-trapping layer: a first-principles study"
Fengyu Ye from #WuhanUniversity
Explore the cutting-edge research in material science and semiconductor technology!
➡️ https://bit.ly/3WWSf0v
#MaterialScience #Semiconductors #Nanotechnology #Physics #AcademicPublishing #ScientificResearch #HfO2 #OpenAccess #FirstPrinciples #Reliability #ScienceMastodon @ScienceScholar @academicsunite
@academicchatter
The reliability impact of N doping on the HfO2 charge-trapping layer: a first-principles study | The European Physical Journal Applied Physics (EPJ AP)
The European Physical Journal Applied Physics (EPJ AP) an international journal devoted to the promotion of the recent progresses in all fields of applied physics
SciPost Physics